JPH0464784U - - Google Patents

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Publication number
JPH0464784U
JPH0464784U JP10769490U JP10769490U JPH0464784U JP H0464784 U JPH0464784 U JP H0464784U JP 10769490 U JP10769490 U JP 10769490U JP 10769490 U JP10769490 U JP 10769490U JP H0464784 U JPH0464784 U JP H0464784U
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JP
Japan
Prior art keywords
rod
unit
contact
measured
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10769490U
Other languages
English (en)
Japanese (ja)
Other versions
JP2533881Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10769490U priority Critical patent/JP2533881Y2/ja
Publication of JPH0464784U publication Critical patent/JPH0464784U/ja
Application granted granted Critical
Publication of JP2533881Y2 publication Critical patent/JP2533881Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
JP10769490U 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造 Expired - Lifetime JP2533881Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10769490U JP2533881Y2 (ja) 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10769490U JP2533881Y2 (ja) 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造

Publications (2)

Publication Number Publication Date
JPH0464784U true JPH0464784U (en]) 1992-06-03
JP2533881Y2 JP2533881Y2 (ja) 1997-04-23

Family

ID=31854336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10769490U Expired - Lifetime JP2533881Y2 (ja) 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造

Country Status (1)

Country Link
JP (1) JP2533881Y2 (en])

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012018043A (ja) * 2010-07-07 2012-01-26 Hioki Ee Corp 基板検査装置
WO2017195470A1 (ja) * 2016-05-11 2017-11-16 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012018043A (ja) * 2010-07-07 2012-01-26 Hioki Ee Corp 基板検査装置
WO2017195470A1 (ja) * 2016-05-11 2017-11-16 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法
WO2017195300A1 (ja) * 2016-05-11 2017-11-16 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法
JP6233946B1 (ja) * 2016-05-11 2017-11-22 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法
US10718792B2 (en) 2016-05-11 2020-07-21 Wit Co., Ltd. Multifunctional substrate inspection apparatus and multifunctional substrate inspection method

Also Published As

Publication number Publication date
JP2533881Y2 (ja) 1997-04-23

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term